InGaAs Cameras
Lens resolution, image circle and spectral response coordinated with the detector format and pixel pitch.
SHORT-WAVE INFRARED • InGaAs IMAGING
Custom SWIR Imaging Lenses
Custom SWIR imaging lenses engineered for InGaAs cameras, machine vision, semiconductor inspection and spectral imaging systems.
SWIR OPTICAL ENGINEERING
Designed Around the Detector and Working Distance
COE Sapphire provides custom SWIR imaging lenses for InGaAs cameras used in machine vision, semiconductor inspection, automated sorting, moisture analysis, spectral imaging and low-light observation. Designs are matched to detector size, pixel pitch, wavelength range, working distance, field of view and mechanical envelope.
Machine Vision
Working distance, field of view, distortion and mechanical interface optimized for industrial inspection.
Spectral Imaging
Material and coating choices developed around the actual short-wave infrared range and transmission target.
APPLICATIONS
Reveal Information Beyond Visible Imaging
SWIR imaging can distinguish materials and process conditions that are difficult to capture in the visible spectrum. Reliable results require a lens that maintains resolution and transmission while controlling distortion, focus shift and stray light.
Semiconductor Inspection
Wafer, package and subsurface inspection with optical performance matched to the camera and process geometry.
Sorting and Moisture Analysis
Optics for agricultural, food, recycling and material-differentiation systems.
Low-Light Observation
Custom lenses for night imaging, surveillance and specialized scientific observation.
MATERIALS & MANUFACTURING
From Optical Design to SWIR Lens Assembly
Fused silica, selected optical glasses, silicon, sapphire and other materials may be considered according to the exact wavelength range and performance objective. Multi-element systems can be optimized for resolution, compact size, working distance or broad spectral coverage.
Design and Tolerancing
Optical layout, glass selection, distortion, tolerance analysis and mechanical interface review aligned with manufacturability.
Coating and Assembly
Band-specific AR coatings, precision centering and mechanical assembly coordinated for the finished SWIR system.
Optical Verification
Dimensional inspection, surface quality, centration, spectral transmission and assembly-level image or MTF testing as required.
Related SWIR Materials and Components
Explore optical materials, filters and coatings that can be integrated into short-wave infrared imaging systems.
SWIR PRODUCTION SUPPORT
Coating, Assembly and Performance Testing
SWIR lens projects are supported with controlled coating, alignment and optical performance verification.
SWIR Coatings
Antireflection designs are coordinated around the detector band, material and angle of incidence.
MTF Testing
Resolution and image performance can be evaluated at the completed lens assembly level.
Lens Assembly
Centering, spacing and mechanical interfaces are coordinated for stable system integration.
Discuss Your SWIR Imaging Requirement
Send the detector format, pixel pitch, wavelength range, focal length, working distance, F-number and target quantity.